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Lecture

Invited lecture: X-ray analyses of materials in cultural soils: Synchrotron microfocus X-ray scattering and X-ray fluorescence analyses of artefacts and ecofacts in archaeological sediments

Citation
Adderley WP Invited lecture: X-ray analyses of materials in cultural soils: Synchrotron microfocus X-ray scattering and X-ray fluorescence analyses of artefacts and ecofacts in archaeological sediments (Presentation) Invited Lecture, New York.

StatusUnpublished
Author(s)Adderley, W Paul
Publication date30/04/2003
ConferenceInvited Lecture
Conference locationNew York
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